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Commit 92d9038e by James Greenhalgh Committed by James Greenhalgh
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[AArch64] Add testcases for FAC, FCM changes. 

gcc/testsuite/
	* gcc.target/aarch64/scalar-vca.c: New.
	* gcc.target/aarch64/vect-vca.c: Likewise.

From-SVN: r198496
parent bd11644e
Showing with 166 additions and 0 deletions
gcc/testsuite/ChangeLog
2013-05-01 James Greenhalgh <james.greenhalgh@arm.com>
* gcc.target/aarch64/scalar-vca.c: New.
* gcc.target/aarch64/vect-vca.c: Likewise.
2013-05-01 James Greenhalgh <james.greenhalgh@arm.com>
* gcc.target/aarch64/scalar_intrinsics.c (force_simd): New.
(test_vceqd_s64): Force arguments to SIMD registers.
(test_vceqzd_s64): Likewise.
......
gcc/testsuite/gcc.target/aarch64/scalar-vca.c 0 → 100644
/* { dg-do run } */
/* { dg-options "-O3 --save-temps" } */
#include <arm_neon.h>
extern void abort (void);
extern float fabsf (float);
extern double fabs (double);
#define NUM_TESTS 8
float input_s1[] = {0.1f, -0.1f, 0.4f, 10.3f, 200.0f, -800.0f, -13.0f, -0.5f};
float input_s2[] = {-0.2f, 0.4f, 0.04f, -100.3f, 2.0f, -80.0f, 13.0f, -0.5f};
double input_d1[] = {0.1, -0.1, 0.4, 10.3, 200.0, -800.0, -13.0, -0.5};
double input_d2[] = {-0.2, 0.4, 0.04, -100.3, 2.0, -80.0, 13.0, -0.5};
#define TEST(TEST, CMP, SUFFIX, WIDTH, F) \
int \
test_fca##TEST##SUFFIX##_float##WIDTH##_t (void) \
{ \
int ret = 0; \
int i = 0; \
uint##WIDTH##_t output[NUM_TESTS]; \
\
for (i = 0; i < NUM_TESTS; i++) \
{ \
float##WIDTH##_t f1 = fabs##F (input_##SUFFIX##1[i]); \
float##WIDTH##_t f2 = fabs##F (input_##SUFFIX##2[i]); \
/* Inhibit optimization of our linear test loop. */ \
asm volatile ("" : : : "memory"); \
output[i] = f1 CMP f2 ? -1 : 0; \
} \
\
for (i = 0; i < NUM_TESTS; i++) \
{ \
output[i] = vca##TEST##SUFFIX##_f##WIDTH (input_##SUFFIX##1[i], \
input_##SUFFIX##2[i]) \
^ output[i]; \
/* Inhibit autovectorization of our scalar test loop. */ \
asm volatile ("" : : : "memory"); \
} \
\
for (i = 0; i < NUM_TESTS; i++) \
ret |= output[i]; \
\
return ret; \
}
TEST (ge, >=, s, 32, f)
/* { dg-final { scan-assembler "facge\\ts\[0-9\]+, s\[0-9\]+, s\[0-9\]+" } } */
TEST (ge, >=, d, 64, )
/* { dg-final { scan-assembler "facge\\td\[0-9\]+, d\[0-9\]+, d\[0-9\]+" } } */
TEST (gt, >, s, 32, f)
/* { dg-final { scan-assembler "facgt\\ts\[0-9\]+, s\[0-9\]+, s\[0-9\]+" } } */
TEST (gt, >, d, 64, )
/* { dg-final { scan-assembler "facgt\\td\[0-9\]+, d\[0-9\]+, d\[0-9\]+" } } */
int
main (int argc, char **argv)
{
if (test_fcages_float32_t ())
abort ();
if (test_fcaged_float64_t ())
abort ();
if (test_fcagts_float32_t ())
abort ();
if (test_fcagtd_float64_t ())
abort ();
return 0;
}
/* { dg-final { cleanup-saved-temps } } */
gcc/testsuite/gcc.target/aarch64/vect-vca.c 0 → 100644
/* { dg-do run } */
/* { dg-options "-O3 --save-temps" } */
#include <arm_neon.h>
extern void abort (void);
extern float fabsf (float);
extern double fabs (double);
#define NUM_TESTS 8
float input_s1[] = {0.1f, -0.1f, 0.4f, 10.3f, 200.0f, -800.0f, -13.0f, -0.5f};
float input_s2[] = {-0.2f, 0.4f, 0.04f, -100.3f, 2.0f, -80.0f, 13.0f, -0.5f};
double input_d1[] = {0.1, -0.1, 0.4, 10.3, 200.0, -800.0, -13.0, -0.5};
double input_d2[] = {-0.2, 0.4, 0.04, -100.3, 2.0, -80.0, 13.0, -0.5};
#define TEST(T, CMP, SUFFIX, WIDTH, LANES, Q, F) \
int \
test_vca##T##_float##WIDTH##x##LANES##_t (void) \
{ \
int ret = 0; \
int i = 0; \
uint##WIDTH##_t output[NUM_TESTS]; \
\
for (i = 0; i < NUM_TESTS; i++) \
{ \
float##WIDTH##_t f1 = fabs##F (input_##SUFFIX##1[i]); \
float##WIDTH##_t f2 = fabs##F (input_##SUFFIX##2[i]); \
/* Inhibit optimization of our linear test loop. */ \
asm volatile ("" : : : "memory"); \
output[i] = f1 CMP f2 ? -1 : 0; \
} \
\
for (i = 0; i < NUM_TESTS; i += LANES) \
{ \
float##WIDTH##x##LANES##_t in1 = \
vld1##Q##_f##WIDTH (input_##SUFFIX##1 + i); \
float##WIDTH##x##LANES##_t in2 = \
vld1##Q##_f##WIDTH (input_##SUFFIX##2 + i); \
uint##WIDTH##x##LANES##_t expected_out = \
vld1##Q##_u##WIDTH (output + i); \
uint##WIDTH##x##LANES##_t out = \
veor##Q##_u##WIDTH (vca##T##Q##_f##WIDTH (in1, in2), \
expected_out); \
vst1##Q##_u##WIDTH (output + i, out); \
} \
\
for (i = 0; i < NUM_TESTS; i++) \
ret |= output[i]; \
\
return ret; \
}
#define BUILD_VARIANTS(T, CMP) \
TEST (T, CMP, s, 32, 2, , f) \
TEST (T, CMP, s, 32, 4, q, f) \
TEST (T, CMP, d, 64, 2, q, )
BUILD_VARIANTS (ge, >=)
/* { dg-final { scan-assembler "facge\\tv\[0-9\]+\.2s, v\[0-9\]+\.2s, v\[0-9\]+\.2s" } } */
/* { dg-final { scan-assembler "facge\\tv\[0-9\]+\.4s, v\[0-9\]+\.4s, v\[0-9\]+\.4s" } } */
/* { dg-final { scan-assembler "facge\\tv\[0-9\]+\.2d, v\[0-9\]+\.2d, v\[0-9\]+\.2d" } } */
BUILD_VARIANTS (gt, >)
/* { dg-final { scan-assembler "facgt\\tv\[0-9\]+\.2s, v\[0-9\]+\.2s, v\[0-9\]+\.2s" } } */
/* { dg-final { scan-assembler "facgt\\tv\[0-9\]+\.4s, v\[0-9\]+\.4s, v\[0-9\]+\.4s" } } */
/* { dg-final { scan-assembler "facgt\\tv\[0-9\]+\.2d, v\[0-9\]+\.2d, v\[0-9\]+\.2d" } } */
/* No need for another scan-assembler as these tests
also generate facge, facgt instructions. */
BUILD_VARIANTS (le, <=)
BUILD_VARIANTS (lt, <)
#undef TEST
#define TEST(T, CMP, SUFFIX, WIDTH, LANES, Q, F) \
if (test_vca##T##_float##WIDTH##x##LANES##_t ()) \
abort ();
int
main (int argc, char **argv)
{
BUILD_VARIANTS (ge, >=)
BUILD_VARIANTS (gt, >)
BUILD_VARIANTS (le, <=)
BUILD_VARIANTS (lt, <)
return 0;
}
/* { dg-final { cleanup-saved-temps } } */
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