[PATCH][ARM] Fix for testcase after r228661

This patch addresses PR-67948 by changing the xor-and.c test,
initially written for a simplify-rtx pattern, to make it pass post
r228661 (see
https://gcc.gnu.org/ml/gcc-patches/2015-10/msg00676.html). This test
no longer triggered the simplify-rtx pattern it was written for prior
to r228661, though other optimizations did lead to the same assembly
the test checked for. The optimization added with r228661 matches the
pattern used in the test and optimizes it to a better and still valid
sequence. Being unable to easily change the test to trigger the
original simplify-rtx pattern, I chose to change it to pass with the
new produced assembly sequence.

This is correct because the transformation is valid and it yields a
more efficient pattern. However, as I pointed out before this test
doesn't test the optimization it originally was intended for.

Tested by running regression tests for armv6.

Is this OK to commit?

Thanks, Andre

2015-10-22  Andre Vieira  <andre.simoesdiasvieira@arm.com>

	PR testsuite/67948
	* gcc.target/arm/xor-and.c: Adjust test to check for eor
	instead of orr.

From-SVN: r229161

gcc/testsuite/ChangeLog

+2015-10-22  Andre Vieira  <andre.simoesdiasvieira@arm.com>
+
+	PR testsuite/67948
+	* gcc.target/arm/xor-and.c: Adjust test to check for eor
+	instead of orr.
+
 2015-10-22  Jiong Wang  <jiong.wang@arm.com>
 	    Ramana Radhakrishnan  <ramana.radhakrishnan@arm.com>
 

gcc/testsuite/gcc.target/arm/xor-and.c

@@ -10,6 +10,6 @@ unsigned short foo (unsigned short x)
   return x;
 }
 
-/* { dg-final { scan-assembler "orr" } } */
+/* { dg-final { scan-assembler "eor" } } */
 /* { dg-final { scan-assembler-not "mvn" } } */
 /* { dg-final { scan-assembler-not "uxth" } } */